TEM (Tecnai) 이미지

TEM (Tecnai)

Model
FEI (Tecnai F20 G2)
Location
L5117E
Tel
02-958-5983

Transmission electron microscope equipped with field emission gun has sub nm image resolution and spatial resolution, necessary for nano scale analysis of advanced materials. Atomic resolution imaging as well as nano region spectroscopic imaging using PEELS and energy filtering is possible. With an addition of Lorentz lens and holographic unit, electrical and magnetic field measurement can be made.

Specifications

  • Accelerating voltage : 50 ~ 200 kV

  • Image resolution : < 0.23 nm

  • Electron probe size : < 0.3 nm

  • Magnification : 25 ~ 1,030,000 X

  • Specimen double tilting : ±40°/ ±20°

Applications

  • BF/DF/SADP/CBED

  • High resolution structure analysis

  • EDS

  • EELS

  • Electron holography

  • Lorentz microscopy

  • Electron tomography

Application examples

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TEM (Tecnai)

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