TEM Sampling-재료 이미지

TEM Sampling-재료

Model
PIPS with LN2 cooling, Multiprep, Tripod polisher, Dimpler, Saw, Punch, Cutter
Location
L5144
Tel
02-958-6972

Precision Metallographic Angle Lapping and Thinning Sample Preparation for : Light Microscopy, Scanning Electron Microscopy, Atomic Force Microscopy, Mechanical magnification of finite structural features, Wedge sample preparation for TEM, Mechanical slice sample preparation for focused ion beam thinning.

Specifications

  • Ion Guns :Two Penning ion guns

  • Milling Angle :+10° to -10°, each gun independently adjustable

  • Ion Beam Energy : 100 eV to 6.0 keV

  • Beam Diameter : 350 μm FWHM at 5 keV - 800 μm FWHM at 5 keV for broad beam guns

  • Ion Current Density :10 mA/cm2 Peak

  • Beam Modulation :Single or double sector for exceptional cross-sectioning

  • Liquid Nitrogen cooling stage

  • Ion Milling monitoring system

Applications

  • Low energy Ar ion milling by PIPS

  • Ion milling with LN2 cooling

  • Package chip, specific face sampling

  • Dimpler

  • Polishing (tridpod, multiprep, disk grinder, etc.)

  • Mounting

  • Sawing (SiC, diamond plate)

  • Bonding (G1 epoxy, glass)

  • Ultrasonic diskpunch

  • Metal Punch

Application examples

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TEM Sampling-재료

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    오전 09:00 ~ 12:00 오후 13:00 ~ 18:00 예약자가 있는 시간대는 예약불가입니다.