AFM (XE-100) 이미지

AFM (XE-100)

Model
XE-100 (Park Systems, Korea)
Location
L2333
Tel
02-958-5976

Atomic force microscopy (AFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The AFM is one of the foremost tools for imaging, measuring, and manipulating matter at the nanoscale. The information is gathered by "feeling" the surface with a mechanical probe.

Specifications

  • Decoupled XY and Z scanner

  • Scan range of XY scanner : 50 μm

  • Scan range of Z scanner : 25 μm

  • Resolution : 2~3 Å lateral, 0.1 Å vertical

  • Accessory : Heating sample stage (~250 ℃)

Applications

  • Contact, Non-contact, Tapping mode

  • Lateral force microscopy (LFM)

  • Force-distance spectroscopy

  • Phase image

  • Conductive AFM (I-AFM, CAFM)

  • Electrostatic force microscopy (EFM)

  • Electric information : Surface potential, charge distribution

  • Liquid AFM

Application examples

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AFM (XE-100)

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