TEM (Titan) 이미지

TEM (Titan)

Model
FEI (TitanTM 80-300)
Location
5117D
Tel
02-958-5986

Titan 80-300™ microscope transfers information deep into sub-Å resolution making way for the highest performance available in both TEM and STEM. Titan obtains a better lateral resolution than 1 Å and energy resolution down to 0.1 eV. This presents new information of the electronic properties of materials such as bonding states or band gaps with unprecedented spatial resolution.

Specifications

  • Ultra-stable Schottky field emitter gun (XFEG)

  • Accelerating voltage : 80 ~ 300 kV

  • Image resolution : < 0.1 nm

  • Electron probe size : < 0.09 nm

  • Magnification : 25 ~ 1,250,000 X

  • Probe Cs corrector

  • Mono chromater

Applications

  • BF/DF/STEM/HAADF/SADP/CBED/NBD

  • High resolution structure analysis

  • EDS

  • HREELS

  • Lorentz microscopy

Application examples

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TEM (Titan)

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