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팀소개

STRUCTURE&SURFACE ANALYSIS

구조/표면 분석팀

표면의 물리 화학은 첨단 재료 과학과 기술 분야에서 가장 도전적이고 흥미 진진한 분야 중 하나입니다. 구조 및 표면 분석 팀은 원소 이미징, 구조 분석, 성분 분석을 다루는 고급 복합 재료 특성화 기술개발에 중점을 둡니다.

주요연구 분야

Research fields of the SSA team
1

Quantitative analysis of elements

2

Electronic structure of materials

3

Fine tand molecular orientation of polymer

4

Structural morphological analysis from micron to submicron

AES, SIMS
Quantitative
Depth distriboution
MEIS, PIXE

Chemical bonding state Depth distribution

XPS
Chemical shift Chemical
bonding state Valence band Dos
NEXAFS, PES

Chemical bonding state
Unoccupied structure

XRD, SAXS
Chemical phase
Crystal structure
XPS, EXAFS

Chemical bonding state Fine strucure

Supporting structure and surface analysis techniques
Elemental
analysis

XRF, XPS, AES, TOF-SIMS, D-SIMS

Depth
profiles

XPS, AES, TOF-SIMS, D-SIMS

2D, 3D
Imaging analysis

AFM, AES, TOF-SIMS, D-SIMS

Structural
analysis

XRD, USANS, NEXAFS, EXAFS

Structure Analysis

The physics and chemistry of surfaces are among the most challenging and exciting areas of advanced materials science and technology. Structure Analysis focuses on the development of advanced composite materials.

Seeing and measuring the atomic-scale surface structure of nature.
연구분야

XRD/PXRD를 이용한 다결정질 재료의 구조, 조성, 물성에 관한 연구

HRXRD를 이용한 에피층 박막재료 구조특성 연구

SAXS를 이용한 나노입자, 고분자의 전자 밀도차에 따른 크기, 모양, 분포 등의 연구

XRF를 이용한 재료의 비파괴적인 원소 및 화학 분석

XRR를 이용한 박막의 밀도, 거칠기, 두께 비파괴 분석

NEXAFS를 이용한 엑스선을 흡수하는 원자의 화학적 특성과, 그 원소 주위 한곳 구조에 (local structure) 관한 연구

Quantitative and Structure Analysis by X-ray Scattering

A family of non-destructive analytical techniques (XRD, In-situ XRD, HR-XRD, XRR, SAXS, XRF) which reveal information about the crystal structure, chemical composition, and physical properties of materials and thin films.

  • in-situ XRD(SmO)
  • RSM analysis GaAs/GaAs(110)
  • X-Ray Reflectivity Mo/Si sub
Structural Analysis of Molecule Materials by Neutron Scattering

HR-SANs (High Resolution Small Angle Neutron Scattering) measure large size structures: size, shape, cluster-aggregate, interface, and fractals of soft and hard matter in liquid, membrane, and solid samples.

Fine Structure Analysis by Synchrotron

The molecular surface composition and microscopic morphology for the diblock copolymers are obtained by TOF-SIMS and AFM, TOF-SIMS depth profiles of alternative patterns with the lamellar spacing structure.


EXAFS(Extended X-ray absorption fine structure) analysis the localized fine structure change during the chemical reaction.

XANS(X-ray absorption near-edge structure) is sensitive to charge transfer, orbital occupancy, and symmetry.

Nano Letters 2014, 14, 416-422
Molecular Orientation Analysis by X-ray Absorption

NEXAFS(Near-edge X-ray absorption fine structure) is element-specific and bond-sensitive technique, gives informations such as chemical environment of atom, oxide state, site symmetry, density of state(DOS) in final state.

The orientation of molecular backbone in the films.

Surface Analysis

The physics and chemistry of surfaces are among the most challenging and exciting areas of advanced materials science and technology. Surface Analysis focuses on the development of advanced materials characterization techniques covering elemental imaging, electronic structure and chemical analysis, compositional analysis.

Seeing and measuring the atomic-scale surface structure of nature.
Research missions of the SSA team are

Establishing the research infra meeting the national demand

Educating the professionals and experts in practical surface analysis

Developing various advanced techniques and instruments for surface analysis

Customizing in-situ analytical tools for individuals actively working in the advanced materials research.

Quantitative Analysis by Surface Analytical Techniques

Compositional analyses of thin films can be performed by depth profiling in AES, XPS, TOF-SIMS, and D-SIMS, Depth-resolved elemental and MCs+ cluster analysis of thin films provide the average atomic concentrations and information of elemental gradient distribution.

Applied Physics A(2014)
Depth Profiling and Imaging Analysis of Block Copolymers

The molecular surface composition and microscopic morphology for the diblock copolymers are obtained by TOF-SIMS and AFM, TOF-SIMS depth profiles of alternative patterns with the lamellar spacing structure.

Surf. Interface Anal. (2013) 45, 498-502